CHARACTERIZATION OF Si1-xGex/Si HETEROSTRUCTURES USING OPTICALLY-DETECTED MAGNETIC RESONANCE
- 著者名:
Kennedy, T.A. Glaser, E.R. Trombetta, J.M. Wang, K.L. Chern, C.H. Albert-Engels, V. - 掲載資料名:
- Silicon molecular beam epitaxy : symposium held April 29-May 3, 1991, Anaheim, California, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 220
- 発行年:
- 1991
- 開始ページ:
- 271
- 終了ページ:
- 276
- 総ページ数:
- 6
- 出版情報:
- Pittsburgh, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558991149 [155899114X]
- 言語:
- 英語
- 請求記号:
- M23500/220
- 資料種別:
- 国際会議録
類似資料:
1
国際会議録
Electrically and Optically Detected Magnetic Resonance Studies of GaN-Based Heterostructures
Trans Tech Publications |
Materials Research Society |
Materials Research Society |
Materials Research Society |
Trans Tech Publications |
Materials Research Society |
Materials Research Society |
Materials Research Society |
Materials Research Society |
MRS - Materials Research Society |
Materials Research Society |
Materials Research Society |