INVESTIGATION OF DEEP LEVEL DEFECTS IN MERCURIC IODIDE BY THERMALLY STIMULATED CURRENT SPECTROSCOPY

INVESTIGATION OF DEEP LEVEL DEFECTS IN MERCURIC IODIDE BY THERMALLY STIMULATED CURRENT SPECTROSCOPY

著者名:

Bao, X.J.

掲載資料名:

Defects in materials : symposium held November 26-29, 1990, Boston, Massachusetts, U.S.A.

シリーズ名:

Materials Research Society symposium proceedings

シリーズ巻号:

209

発行年:

1991

開始ページ:

541

終了ページ:

546

総ページ数:

6

出版情報:

Pittsburgh, Pa.: Materials Research Society

ISSN:

02729172

ISBN:

9781558991019 [1558991018]

言語:

英語

請求記号:

M23500/209

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00015693
シリーズID:	PA00000011
会議名:	Symposium on defects in materials
回次:	1990
会議開催地:	Boston, MA, USA
会議開催年:	1990.11.26-1990.11.29

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2 国際会議録 PHOTOLUMINESCENCE STUDIES OF IMPURITIES AND DEFECTS IN MERCURIC IODIDE Bao, X.J., Schlesinger, T.E., James, R.B., Cheng, A.Y., Ortale, C. Materials Research Society	8 国際会議録 Investigation of an alternative chemical etchant for mercuric iodide detectors David, Dominique C., Scyoc, J. V., Khudatyan, Mardik, James, R. B., Anderson, R. J., Schlesinger, T. E. MRS - Materials Research Society
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