X-RAY REFLECTIVITY MEASUREMENTS OF SURFACE ROUGHNESS USING ENERGY DISPERSIVE DETECTION

X-RAY REFLECTIVITY MEASUREMENTS OF SURFACE ROUGHNESS USING ENERGY DISPERSIVE DETECTION

著者名:

掲載資料名:

Advances in surface and thin film diffraction : symposium held November 27-29, 1990, Boston, Massachusetts, U.S.A.

シリーズ名:

Materials Research Society symposium proceedings

シリーズ巻号:

208

発行年:

1991

開始ページ:

351

終了ページ:

356

総ページ数:

6

出版情報:

Pittsburgh, Pa.: Materials Research Society

ISSN:

02729172

ISBN:

9781558991002 [155899100X]

言語:

英語

請求記号:

M23500/208

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00015692
シリーズID:	PA00000011
会議名:	Symposium on advances in surface and thin film diffraction
回次:	1990
会議開催地:	Boston, MA, USA
会議開催年:	1990.11.27-1990.11.29

類似資料:

1 国際会議録 NON-DESTRUCTIVE CHARACTERIZATION OF POROUS SILICON USING X-RAY REFLECTIVITY Chason, E., Guilinger, T. R., Kelly, M. J., Headley, T. J., Howard, A. J. MRS - Materials Research Society	7 国際会議録 Liquid mixture detection by InGaAsP semiconductor lasers Zhu,X., Cassidy,D.T. SPIE-The International Society for Optical Engineering
2 国際会議録 Evolution of Surface Roughness During CVD Growth Chason, E., Mayer, T. M., Adams, D. P., Huang, H., Rubia, T. Diaz de la, Gilmer, G., Kellerman, B. K. MRS - Materials Research Society	8 国際会議録 X-ray measurement of regional blood flow distribution using radiopaque contrast medium: influence of gravity Clough,A.V., Haworth,S.T., Roerig,D.T., Hanger,C.C., Dawson,C.A. SPIE-The International Society for Optical Engineering
3 国際会議録 Correlation between x-ray reflectivity measurements and surface roughness of AXAF coated witness samples Clark,A.M., Bruni,R.J., Romaine,S.E., Schwartz,D.A., Speybroeck,L.P.Van, Yip,P.W., Drehman,A.J., Shapiro,A.P. SPIE-The International Society for Optical Engineering	9 国際会議録 In-situ x-ray reflectivity measurement of the interface roughness of tantalum pentoxide thin film during rf magnetron sputtering deposition Lee, C.-H, Huang, T.-W, Lee, H.-Y., Hsieh, Y.-W. SPIE-The International Society for Optical Engineering
4 国際会議録 Comparison between the atomic force microscopy and x-ray reflectivity on the characterization of the roughness of a surface Su, H.-C., Lin, M.-Z., Huang, T.-W., Lee, C.-H. SPIE - The International Society of Optical Engineering	10 国際会議録 Characterization of Semiconductor Surfaces and Interfaces by X-Ray Reflectivity Measurements Plotz,W., Holy,V., Hoogenhof,W.V.D., Ahrer,W., Frank,N., Schiller,C., Lischka,K. Trans Tech Publications
5 国際会議録 Ge SURFACE DISPLACEMENTS DUE TO LOW ENERGY PARTICLES Picraux, S. T., Horn, K. M., Chason, E., Tsao, J. Y., Bedrossian, P., Klitsner, T., Brice, D. K. Materials Research Society	11 国際会議録 Surface classification using artificial neural networks Mainsah,E., Ndumu,D.T., Ndumu,A.N. SPIE-The International Society for Optical Engineering
6 国際会議録 Sputter Roughening Instability on the Ge(001) Surface: Energy and Flux Dependence Chason, E., Mayer, T. M., Kellerman, B. K. MRS - Materials Research Society	12 国際会議録 Analysis of Reflectivity Measurements for GaN Films Grown on GaAs:Influence of Surface Roughness and Interface Layers Shokhovets,S., Goldhahn,R., Cimalla,V., Cheng,T.S., Foxon,C.T. Trans Tech Publications

1

2

3

4

5

6

7

8

9

10

11

12