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*SURFACE ANALYSIS DURING THE GROWTH OF Ge AND GeXSi1-X ALLOYS ON Si BY REFLECTION ELECTRON ENERGY LOSS SPECTROMETRY

著者名:
掲載資料名:
Advances in surface and thin film diffraction : symposium held November 27-29, 1990, Boston, Massachusetts, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
208
発行年:
1991
開始ページ:
251
終了ページ:
260
総ページ数:
10
出版情報:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558991002 [155899100X]
言語:
英語
請求記号:
M23500/208
資料種別:
国際会議録

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