X-RAY CHARACTERIZATION OF MBE-GROWN InXGa1-XSb/InAs STRAINED LAYER SUPERLATTICES
- 著者名:
Chow, P.C. Vigliante, A. Moss, S.C. Zborowski, J.T. Golding, T.D. Shih, M.D. - 掲載資料名:
- Advances in surface and thin film diffraction : symposium held November 27-29, 1990, Boston, Massachusetts, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 208
- 発行年:
- 1991
- 開始ページ:
- 219
- 終了ページ:
- 224
- 総ページ数:
- 6
- 出版情報:
- Pittsburgh, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558991002 [155899100X]
- 言語:
- 英語
- 請求記号:
- M23500/208
- 資料種別:
- 国際会議録
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