Blank Cover Image

IMPROVED KINEMATICAL X-RAY ROCKING CURVE ANALYSES

著者名:
掲載資料名:
Advances in surface and thin film diffraction : symposium held November 27-29, 1990, Boston, Massachusetts, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
208
発行年:
1991
開始ページ:
149
終了ページ:
154
総ページ数:
6
出版情報:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558991002 [155899100X]
言語:
英語
請求記号:
M23500/208
資料種別:
国際会議録

類似資料:

Wie, C. R., Choi, Y. W., Kim,. H. M, Chen, J. F., Vreeland Jr., T., Tsai, C.-J

Materials Research Society

Wie, C. R.

Materials Research Society

Kim, H. M., Choi, Y-W., Vernon, S. M., Moise, P. S, Wie, C. R.

Materials Research Society

Yoganathan, M., Emorhokpor, E., Kerr, T., Gupta, A., Tanner, C.D., Zwieback, I.

Trans Tech Publications

Anathanarayanan, T. S., Rosemier, R. G., Mayo, W. E., Dinan, J. H.

Materials Research Society

Wie, C. R., Xie, K., Burns, G., Dacol, F. H., Pettit, D., Woodall, J. M.

Materials Research Society

Pratt,H.M., Langlotz,C.P., Feingold,E.R., Schwartz,J.S., Kundel,H.L.

SPIE-The International Society for Optical Engineering

Choi, Y-W., Kim, H. M., Rajeswaran, G., Wie, C. R.

Materials Research Society

Paine, B.M.

Materials Research Society

Moran, P.D., Matyi, R.J.

Materials Research Society

M. Yoganathan, P. Wu, I. Zwieback

Trans Tech Publications

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12