*PHASE TRANSITIONS NEAR SURFACES STUDIED BY GRAZING INCIDENCE DIFFRACTION OF X-RAYS

*PHASE TRANSITIONS NEAR SURFACES STUDIED BY GRAZING INCIDENCE DIFFRACTION OF X-RAYS

著者名:

掲載資料名:

Advances in surface and thin film diffraction : symposium held November 27-29, 1990, Boston, Massachusetts, U.S.A.

シリーズ名:

Materials Research Society symposium proceedings

シリーズ巻号:

208

発行年:

1991

開始ページ:

87

終了ページ:

98

総ページ数:

12

出版情報:

Pittsburgh, Pa.: Materials Research Society

ISSN:

02729172

ISBN:

9781558991002 [155899100X]

言語:

英語

請求記号:

M23500/208

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00015692
シリーズID:	PA00000011
会議名:	Symposium on advances in surface and thin film diffraction
回次:	1990
会議開催地:	Boston, MA, USA
会議開催年:	1990.11.27-1990.11.29

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2 国際会議録 Strain and Shape in Self-Assembled Quantum Dots Studied by X-ray Grazing Incidence Diffraction Kegel, I., Metzger, T. H., Peisl, J., Fratzl, P., Lorke, A., Kotthaus, J. P., Garcia, J. M., Petroff, P. M. MRS - Materials Research Society	8 国際会議録 NEUTRON-ZWISCHENREFLEX-SCATTERING FROM POINT DEFECTS IN CRYSTALS Dosch, H., Peisl Materials Research Society
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4 国際会議録 Semiconductor Superlattices Studied by Grazing X-ray Scattering and Diffraction Ming, Z. H., Soo, Y. L., Huang, S., Kao, Y. H., Stair, K., Devane, G., Choi-Feng, C., Chang, T., Fu, L. P., Gilliland, … MRS - Materials Research Society	10 国際会議録 MICROSTRUCTURE OF EPITAXIAL Al(111)/Si(111) FILMS STUDIED BY SYNCHROTRON GRAZING INCIDENCE X-RAY DIFFRACTION Hung, H.H., Liang, K.S., Lee, C.H., Lu, T.-M. Materials Research Society
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