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STRUCTURAL INVESTIGATION OF THE SILVER-POLYIMIDE INTERFACE BY CROSS-SECTIONAL TEM AND ION-BEAM SPUTTERING

著者名:
掲載資料名:
Electronic packaging materials science V : symposium held November 26-29, 1990, Boston, Massachusetts, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
203
発行年:
1991
開始ページ:
59
終了ページ:
64
総ページ数:
6
出版情報:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558990951 [155899095X]
言語:
英語
請求記号:
M23500/203
資料種別:
国際会議録

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