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MISFIT DISLOCATIONS AT THE CRITICAL THICKNESS FOR InGaAs/GaAs STRAINED LAYERS

著者名:
Green, G.S.
Tanner, B.K.
Turnbull, A.G.
Barnett, S.J.
Emeny, M.
Whitehouse, C.R.
さらに 1 件
掲載資料名:
Evolution of thin-film and surface microstructure : symposium held November 26-December 1, 1990, Boston, Massachusetts, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
202
発行年:
1991
開始ページ:
507
終了ページ:
512
総ページ数:
6
出版情報:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558990944 [1558990941]
言語:
英語
請求記号:
M23500/202
資料種別:
国際会議録

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