Blank Cover Image

*ION-SURFACE INTERACTIONS DURING EPITAXY

著者名:
掲載資料名:
Surface chemistry and beam-solid interactions : symposium held November 26-29, 1990, Boston, Massachusetts, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
201
発行年:
1991
開始ページ:
43
終了ページ:
56
総ページ数:
14
出版情報:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558990074 [1558990070]
言語:
英語
請求記号:
M23500/201
資料種別:
国際会議録

類似資料:

1 国際会議録 Novel applications of low-energy ions in molecular beam epitaxy of III-V semiconductors

S.A. Barnett, J. Mirecki-Millunchick, J.G. Labanda, R. Kaspi, L. Hultman

Society of Photo-optical Instrumentation Engineers
7 国際会議録 Surface Modification of Polymer by Ion-Assisted Reaction in Reactive Gases Environment

Koh, S-K., Choi, S. C., Choi, W-K., Jung, H-J., Hur, H. H.

MRS - Materials Research Society
2 国際会議録 ION ENERGY AND DOSE EFFECTS DURING ION-ASSITED EPITAXIAL GROWTH OF InAs ON Si (100)

Choi, C.-H., Barnet, S.A.

Materials Research Society
8 国際会議録 Surfactant-Mediated Growth of AlGaAs by Molecular Beam Epitaxy

Kaspi, Ron, Evans, Keith R., Reynolds, Don C., Brown, Jeff, Skowronski, Marek

MRS - Materials Research Society
3 国際会議録 LOW-ENERGY ION/SURFACE INTERACTIONS DURING FILM GROWTH KINETICS, DEFECT STRUCTURE, AND ELEMENTAL INCORPORATION PROBABILITIES

Greene E. J., Barnett A. S., Sundgren -E. J., Rockett A.

Kluwer Academic Publishers
9 国際会議録 Threshold residual ion concentration on photomask surface to prevent haze defects

J. -M. Kim, J. -C. Lee, D. -S. Kang, D. -H. Lee, C. Shin, M. -H. Choi, S. -S. Choi

SPIE - The International Society of Optical Engineering
4 国際会議録 SURFACE ACCUMULATION OF BORON DURING Si MOLECULAR BEAM EPITAXY

Parry, C. P., Kubiak, R.A.A., Newstead, S.M., Parker, E.C.H., Whall, T.E.

Materials Research Society
10 国際会議録 In-Situ Monitoring of Crystal Growth Using Specular Ion Current Oscillations

Deluca, P.M., Ruthe, K.C., Barnett, S.A.

Electrochemical Society
5 国際会議録 Interaction of Water and Aqueous chromium Ions with Iron Oxide Surfaces

Jr.,G.E.Brown, Chambers,S.A., Amonette,J.E., Rustad,J.R., Kendelewicz,T., Liu,P., Doyle,C.S., Grolimund,D., …

American Chemical Society
11 国際会議録 Surface Effects During Ion Beam Processing of Materials

Averback, R. S., Ghaly, Mai, Zhu, H., Caturla, M. J., Marques, L., Rubia, T. Diaz de la

MRS - Materials Research Society
6 国際会議録 Dynamics of Surface Segregation During InGaAs MBE

Evans, Keith R., Kaspi, R., Ehret, J. E., Skowronski, M.

MRS - Materials Research Society
12 国際会議録 Measurement and Control of the Indium Composition Profile near the InGaAs Interface During MBE

Kaspi, Ron, Evans, Keith R.

MRS - Materials Research Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12