HYDROGEN DILUTION OF SILANE: CORRELATION BETWEEN THE STRUCTURE AND OPTICAL BAND GAP IN GD a_Si:H FILMS

HYDROGEN DILUTION OF SILANE: CORRELATION BETWEEN THE STRUCTURE AND OPTICAL BAND GAP IN GD a_Si:H FILMS

著者名:

掲載資料名:

Amorphous silicon technology, 1990 : symposium held April 17-20, 1990, San Francisco, California, U.S.A.

シリーズ名:

Materials Research Society symposium proceedings

シリーズ巻号:

192

発行年:

1990

開始ページ:

645

終了ページ:

650

総ページ数:

6

出版情報:

Pittsburgh, Pa.: Materials Research Society

ISSN:

02729172

ISBN:

9781558990814 [155899081X]

言語:

英語

請求記号:

M23500/192

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00015676
シリーズID:	PA00000011
会議名:	Symposium on amorphous silicon technology
回次:	1990
会議開催地:	San Francisco, CA, USA
会議開催年:	1990.04.17-1990.04.20

類似資料:

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2 国際会議録 DEFECT AND BAND GAP ENGINEERING OF AMORPHOUS SILICON SOLAR CELLS Schropp, R.E.I., Daey Ouwens, J., von der Linden, M.B., van der Werf, C.H.M., van der Weg, W.F., Alkemade, P.F.A. Materials Research Society	8 国際会議録 Hot-Wire CVD Poly-Silicon Films for Thin-Film Devices Rath, J. K., Tichelaar, F. D., Meiling, H., Schropp, R. E. I. MRS - Materials Research Society
3 国際会議録 HYDROGEN CONTENT AND THE OPTICAL BANDGAP IN AMORPHOUS SILICON Maessen, K. H. M., Pruppers, M. J.. M., Bezemer, J., Habraken, F. H.. P. M., van der Weg, W. F. Materials Research Society	9 国際会議録 Structural Defects in Thin Film Amorphous Silicon Films Deposited on Textured TCO Material Knoesen, D., Schropp, R. E. I., Weg, W. F. van der MRS - Materials Research Society
4 国際会議録 High-Rate a-Si:H for TFTs: A Comparative Study Meiling, H., van der Weg, W.F., Schropp, R.E.I., Holleman, J. Electrochemical Society	10 国際会議録 Hot-Wire Deposited Amorphous Silicon Thin-Film Transistors Schropp, R. E. I., Feenstra, K. F., Werf, C. H. M. van der, Holleman, J., Meiling, H. MRS - Materials Research Society
5 国際会議録 EFFECTS OF ELECTRODE SPACING AND HYDROGEN DILUTION ON a-SiC:H AND a-Si:H LAYERS Daey Ouwens, J., Schropp, R.E.I., van der Werf, C.H.M., von der Linden, M.B., Maree, C.H.M., van der Weg, W.F., Rava, … Materials Research Society	11 国際会議録 Hot-Wire Deposited Amorphous Silicon Thin-Film Transistors Schropp, R. E. I., Feenstra, K. F., Werf, C. H. M. van der, Holleman, J., Meiling, H. MRS - Materials Research Society
6 国際会議録 HYDROGEN INCORPORATION IN a-Si:H: TEMPERATURE AND DOPING TYPE DEPENDENCE Pruppers, M. J. M., Maessen, K. M. H., Habraken, F. H. P. M., Bezemer, J., Weg, Van der W. F. Materials Research Society	12 国際会議録 The Influence of Frequency and Pressure on the Material Quality of PECVD a-Si:H Sark, W. G. J. H. M. van, Bezemer, J., Heller, E. M. B., Kars, M., Weg, W. F. van der MRS - Materials Research Society

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