Blank Cover Image

RESIDUAL STRESS ANALYSIS OF A MULTI-LAYER THIN FILM STRUCTURE BY DESTRUCTIVE (CURVATURE) AND NON-DESTRUCTIVE (X-RAY) METHODS

著者名:
掲載資料名:
Interfaces between polymers, metals, and ceramics : symposium held April 25-27, 1989, San Diego, California, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
153
発行年:
1989
開始ページ:
363
終了ページ:
368
総ページ数:
6
出版情報:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558990265 [1558990267]
言語:
英語
請求記号:
M23500/153
資料種別:
国際会議録

類似資料:

1 国際会議録 Measurement of Residual Stress in Thermally Grown Oxide Layers in Thermal Barrier Coating Systems - Development of Non-DestructiveTest Methods

Saunders, S.R.J., Banks, J.P., Chen, G., Chunnilall, C.J.

Trans Tech Publications
7 国際会議録 Stress Factors and Absolute Residual Stresses in Thin Films Determined by the Combination of Curvature and sin2Ψ Methods

Martinschitz, K.J., Eiper, E., Kekes, J.

Trans Tech Publications
2 国際会議録 EFFECTS OF HYDROGEN ON THERMAL STRESS IN LAYERED STRUCTURE OF Ti AND Ti (Al) THIN FILMS

Hu,C.-K., Ho, P.S., Gupta, D., Chen, S.T.

Materials Research Society
8 国際会議録 Residual Stress Generation During Constrained Sintering of Layered Ceramic Thin-Film Structures

Busso, E. P., Travis, R. P., Chandra, L.

MRS - Materials Research Society
3 国際会議録 Nondestructive measurement of the residual stress TiN thin film coated on AISI 304 substrate by x-ray stress analyzer [6029-17]

Zhang Y. K., Feng A. X., Lu J. Z., Kong D. J., Tang C. P.

SPIE - The International Society of Optical Engineering
9 国際会議録 Analysis of Residual Stress in Polycrystalline Silver Thin Films by X-ray Diffraction

Alford, T. L., Zeng, Yuxiao, Zou, Y. L., Deng, F., Lau, S. S., Laursen, T., Ullrich, B. Manfred

MRS - Materials Research Society
4 国際会議録 Assumptions in Thin Film Residual Stress Methods

Vermeulen, A.C.

Trans Tech Publications
10 国際会議録 NON-DESTRUCTIVE ANALYSIS OF THIN III-V EPITAXIAL LAYERS USING A TABLE-TOP DOUBLE CRYSTAL X-RAY DIFFRACTOMETER

Sacks, R.N.

Materials Research Society
5 国際会議録 Non-Destructive Residual Stress Analysis of Induction Hardened Components by Neutron and X-Ray Diffraction

J. Epp, T. Pirling, T. Hirsch

Trans Tech Publications
11 国際会議録 A study of active thermography approaches for the non-destructive testing and evaluation of aerospace structures

N. P. Avdelidis, C. Ibarra-Castanedo, Z. P. Marioli-Riga, A. Bendada, X. P. V. Maldague

Society of Photo-optical Instrumentation Engineers
6 国際会議録 Kinetic Analysis and Correlation With Residual Stress of the Ni/Si System in Thin Film

Cacho, F., Aime, D., Wacquant, F., Froment, B., Rivero, C., Gergaud, P., Thomas, O., Cailletaud, G., Jaouen, H., …

Materials Research Society
12 国際会議録 Comparison of substrate curvature and resonant frequency thin film stress mapping techniques

Schlax,M.P., Engelstad,R.L., Lovell,E.G., Brooks,C.J., Magg,C.

SPIE - The International Society for Optical Engineering
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12