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PHOTOREFLECTANCE CHARACTERIZATION OF SILICON FILMS ON INSULATOR

著者名:
Giordana, Adraina
Glosser, R.
Pellegrino, Joseph G.
Qadri, S.
Twigg, M. E.
Richmond, E. D.
Joyner, Keith
Pollack, Gordon
さらに 3 件
掲載資料名:
Thin films : stresses and mechanical properties II : symposium held April 16-19, 1990, San Francisco, California, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
188
発行年:
1990
開始ページ:
349
終了ページ:
354
総ページ数:
6
出版情報:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558990777 [1558990771]
言語:
英語
請求記号:
M23500/188
資料種別:
国際会議録

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