HIGH-RESOLUTION ELECTRON MICROSCOPY OF PLANAR DEFECTS IN AlN

HIGH-RESOLUTION ELECTRON MICROSCOPY OF PLANAR DEFECTS IN AlN

著者名:

掲載資料名:

High resolution electron microscopy of defects in materials : symposium held April 16-18, 1990, San Francisco, California, USA

シリーズ名:

Materials Research Society symposium proceedings

シリーズ巻号:

183

発行年:

1990

開始ページ:

267

終了ページ:

272

総ページ数:

6

出版情報:

Pittsburgh, Pa.: Materials Research Society

ISSN:

02729172

ISBN:

9781558990722 [1558990720]

言語:

英語

請求記号:

M23500/183

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00015667
シリーズID:	PA00000011
会議名:	Symposium on high resolution electron microscopy of defects in materials
回次:	1990
会議開催地:	San Francisco, CA, USA
会議開催年:	1990.04.16-1990.04.18

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2 国際会議録 GRAIN BOUNDARIES IN HIGH THERMAL CONDUCTIVITY ALUMINUM NITRIDE McKernan, Stuart, Norton, M. Grant, Carter, C. Barry Materials Research Society	8 国際会議録 MODIFICATION AND REACTIONS OF ALUMINUM NITRIDE SURFACES Norton, M. Grant, Yang, T.K. Andrew, Kotula, Paul, Rugg, Kevin L., McKernan, Stuart, Carter, C. Barry Materials Research Society
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