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THE APPLICATION OF NEUTRON TOPOGRAPHY TO THE STUDY OF X-RAY SENSITIVE ORGANIC CRYSTALS - A POSSIBLE ALTERNATIVE TO X-RAY TOPOGRAPHY

著者名:
Dudley, M.  
掲載資料名:
Neutron scattering for materials science : symposium held November 27-30, 1989, Boston, Massachusetts, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
166
発行年:
1990
開始ページ:
55
終了ページ:
60
総ページ数:
6
出版情報:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558990548 [1558990542]
言語:
英語
請求記号:
M23500/166
資料種別:
国際会議録

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