Blank Cover Image

DEFECTS IN MBE-GROWN SILICON EPILAYERS STUDIED WITH VARIABLE-ENERGY POSITRONS

著者名:
掲載資料名:
Impurities, defects, and diffusion in semiconductors : bulk and layered structures : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
163
発行年:
1990
開始ページ:
931
終了ページ:
936
総ページ数:
6
出版情報:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558990517 [1558990518]
言語:
英語
請求記号:
M23500/163
資料種別:
国際会議録

類似資料:

Jackrnan,T.E., Aers,C.C., McCailrey,J.P., Britton,D., Willutzkl,P., Schultz,P.J., Simpson,P.J., Mascher,P.

Trans Tech Publications

Charbonneau,N.S., Delage,A., Haysom,J., Yang,F., Poole,P.J., Aers,G.C., He,J.J., Koteles,E.S., Piva,P.G., Simpson,T., …

SPIE-The International Society for Optical Engineering

Simpson,P.J., Vos,M., Mitchell,I.V., Wu,C., Schultz,P.J.

Trans Tech Publications

Trager-Cowan,C., Paterson,A.M., Martin,R.W., O'Donnell,K.P., Mullins,J.T., Horsburgh,G., Prior,K.A., Cavenett,B.C.

Trans Tech Publications

Goldberg, R.D., Leung, T.C., Mitchell, I.V., Schultz, P.J.

Materials Research Society

Koteles,E.S., He,J.J., Charbonneau,S., Poole,P.J., Aers,G.C., Feng,Y., Goldberg,R.D., Mitchell,I.V.

SPIE-The International Society for Optical Engineering

Charbonneau,N.S., Poole,P.J., Aers,G.C., Haysom,J.E., Raymond,S., Piva,P.G., Mitchell,I.V., Simpson,T.

SPIE - The International Society for Optical Engineering

Lefebvre,J., Aers,G.C., Poole,P.J., Williams,R.L.

SPIE - The International Society for Optical Engineering

Landheer, D., Hulse, J.E., Quance, T., Aers, G.C., Sproule, G.I., Lennard, W.N., Simpson, P.J., Nlassoumi, G.R.

Electrochemical Society

P.J. Poole, M. Buchanan, G.C. Aers, Z.R. Wasilewski, M. Dion

Society of Photo-optical Instrumentation Engineers

Simpson,P.J., Akano,U.G., Schultz,P.J., Mitchell,I.V.

Trans Tech Publications

Simpson, P.J., Szpala, S., Knights, A.P.

Trans Tech Publications

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12