*COMPLEX DEFECTS IN SEMICONDUCTORS
- 著者名:
- Monemar, B.
- 掲載資料名:
- Impurities, defects, and diffusion in semiconductors : bulk and layered structures : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 163
- 発行年:
- 1990
- 開始ページ:
- 39
- 終了ページ:
- 50
- 総ページ数:
- 12
- 出版情報:
- Pittsburgh, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558990517 [1558990518]
- 言語:
- 英語
- 請求記号:
- M23500/163
- 資料種別:
- 国際会議録
類似資料:
Trans Tech Publications |
Trans Tech Publications |
Trans Tech Publications |
Materials Research Society |
Materials Research Society |
Materials Research Society |
4
国際会議録
OPTICALLY DETECTED MAGNETIC RESONANCE STUDIES OF COMPLEX ANTISITE-RELATED DEFECTS IN BULK LEC GaP
Materials Research Society |
Materials Research Society |
5
国際会議録
Optically Detected Magnetic Resonance Studies of Bound Exciton Triplets for Complex Defects in GaP
Trans Tech Publications |
Trans Tech Publications |
6
国際会議録
A Novel PGa-Antisite Related Deep Isoelectronic Complex Defect in Gold- and Lithium-Doped GaP
Trans Tech Publications |
MRS - Materials Research Society |