THE USE OF FRESNEL CONTRAST TO STUDY THE INITIAL STAGES OF THE IN SITU OXIDATION OF SILICON

THE USE OF FRESNEL CONTRAST TO STUDY THE INITIAL STAGES OF THE IN SITU OXIDATION OF SILICON

著者名:

掲載資料名:

Atomic scale structure of interfaces : symposium held November 27-29, 1989, Boston Massachusetts, U.S.A.

シリーズ名:

Materials Research Society symposium proceedings

シリーズ巻号:

159

発行年:

1990

開始ページ:

185

終了ページ:

190

総ページ数:

6

出版情報:

Pittsburgh, Pa.: Materials Research Society

ISSN:

02729172

ISBN:

9781558990470 [155899047X]

言語:

英語

請求記号:

M23500/159

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00015643
シリーズID:	PA00000011
会議名:	Symposium on atomic scale structure of interfaces
回次:	1989
会議開催地:	Boston, MA, USA
会議開催年:	1989.11.27-1989.1129

類似資料:

1 国際会議録 ANALYSIS OF COMPOSITION CHANGES ACROSS THE Si/SiOX INTERFACE USING FRESNEL FRINGE CONTRAST ANALYSIS Ross, Frances M., Stobbs, W. M. Materials Research Society	7 国際会議録 In Situ UHV TEM Investigations of the Initial Oxidation Stage of Copper Thin Films Yang, J. C., Yeadon, M., Kolasa, B., Gibson, J. M. MRS - Materials Research Society
2 国際会議録 THE ETCHING OF SILICON BY OXYGEN OBSERVED BY IN SITU TEM Ross, Frances M., Gibson, J. Murray Materials Research Society	8 国際会議録 Kinetic Investigations of the Initial Oxidation Stage of Copper By In Situ UHV-TEM Yang, J. C., Yeadon, M., Kolasa, B., Olynick, D., Gibson, J. M. MRS - Materials Research Society
3 国際会議録 *HIGH ENERGY TRANSMISSION ELECTRON DIFFRACTION FROM SURFACE MONOLAYERS DURING SILICON OXIDATION Ross, Frances M., Gibson, J. Murray Materials Research Society	9 国際会議録 *IN-SITU TRANSMISSION ELECTRON MICROSCOPY OF THE ETCHING OF SILICON (111) SURFACES BY OXYGEN Gibson, J. M., Ross, F. M. Materials Research Society
4 国際会議録 *SILICON SURFACE MORPHOLOGY AND THE REACTION OF SILICON WITH OXYGEN Ross, Frances M., Murray Gibson, J. Materials Research Society	10 国際会議録 The Surface Kinetics of the Initial Oxidation Stages of Copper as Investigated by In Situ Ultra-High Vacuum Transmission Electron Microscopy Yang, J.C., Bhardwaj, M.D., Tropia, L., Gibson, J.M. Trans Tech Publications
5 国際会議録 The Fresnel Method for the Characterisation of Interfaces Stobbs M. W., Ross M. F. Plenum Press	11 国際会議録 IN SITU RHEED AND HREM STUDY OF INITIAL STAGES OF INTERFACIAL REACTIONS OF UHV DEPOSITED TITANIUM THIN FILMS ON SILICON Wang, M. H., Chen, L. J. Materials Research Society
6 国際会議録 IN-SITU STUDIES OF SILICON OXIDATION Gibson, J.M., Lanzerotti, M.Y. Materials Research Society	12 国際会議録 In Situ Observation of an Electrochemical Etching Reaction in Silicon Ross, Frances M., Searson, Peter, C. MRS - Materials Research Society

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