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DEPTH OSCILLATIONS OF PLANAR CHANNELING YIELD IN InP AND GaP FOR LATTICE LOCATION APPLICATIONS

著者名:
Swanson, M. L.
Parikh, N. R.
Sandhu, G. S.
Frey, E. C.
Zhang, Z. H.
Chu, W. K.
さらに 1 件
掲載資料名:
Advances in materials, processing, and devices in III-V compound semiconductors
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
144
発行年:
1989
開始ページ:
409
終了ページ:
414
総ページ数:
6
出版情報:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558990173 [1558990178]
言語:
英語
請求記号:
M23500/144
資料種別:
国際会議録

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