*APPLICATIONS OF POSITRON ANNIHILATION TO THE MONITORING OF FATIGUE DAMAGE AND CREEP IN TECHNOLOGICAL COMPONENTS

*APPLICATIONS OF POSITRON ANNIHILATION TO THE MONITORING OF FATIGUE DAMAGE AND CREEP IN TECHNOLOGICAL COMPONENTS

著者名:

掲載資料名:

Nondestructive monitoring of materials properties : symposium held November 28-30, 1988, Boston, Massachusetts, U.S.A.

シリーズ名:

Materials Research Society symposium proceedings

シリーズ巻号:

142

発行年:

1989

開始ページ:

131

終了ページ:

142

総ページ数:

12

出版情報:

Pittsburgh, Pa.: Materials Research Society

ISSN:

02729172

ISBN:

9781558990159 [1558990151]

言語:

英語

請求記号:

M23500/142

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00015627
シリーズID:	PA00000011
会議名:	Symposium on nondestructive monitoring of materials properties
回次:	1988
会議開催地:	Boston, MA, USA
会議開催年:	1988.11.28-1988.11.30

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