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HIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPY: AN ESSENTIAL CHARACTERIZATION TECHNIQUE FOR OPTIMIZATION OF SEMICONDUCTOR EPITAXY AND INTERFACES

著者名:
Posthill, J.B.
Fountain, G.G.
Rudder, R.A.
Hattangady, S.V.
Solomon, G.S.
Timmons, M.L.
Markunas, R.J.
さらに 2 件
掲載資料名:
High resolution microscopy of materials : symposium held November 29-December 1, 1988, Boston, Massachusetts, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
139
発行年:
1989
開始ページ:
345
終了ページ:
350
総ページ数:
6
出版情報:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558990128 [1558990127]
言語:
英語
請求記号:
M23500/139
資料種別:
国際会議録

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