SCANNING TUNNELING MICROSCOPE WITH A FIELD ION MICROSCOPE
- 著者名:
Hashizume, T. Kamiya, I. Hasegawa, Y. Ide, T. Pickering, H.W. Sakurai, T. - 掲載資料名:
- High resolution microscopy of materials : symposium held November 29-December 1, 1988, Boston, Massachusetts, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 139
- 発行年:
- 1989
- 開始ページ:
- 297
- 終了ページ:
- 302
- 総ページ数:
- 6
- 出版情報:
- Pittsburgh, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558990128 [1558990127]
- 言語:
- 英語
- 請求記号:
- M23500/139
- 資料種別:
- 国際会議録
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