SCANNING TUNNELING MICROSCOPY OF THE CLEAVED SURFACES OF Bi-CONTAINING SUPERCONDUCTORS

SCANNING TUNNELING MICROSCOPY OF THE CLEAVED SURFACES OF Bi-CONTAINING SUPERCONDUCTORS

著者名:

掲載資料名:

High resolution microscopy of materials : symposium held November 29-December 1, 1988, Boston, Massachusetts, U.S.A.

シリーズ名:

Materials Research Society symposium proceedings

シリーズ巻号:

139

発行年:

1989

開始ページ:

169

終了ページ:

174

総ページ数:

6

出版情報:

Pittsburgh, Pa.: Materials Research Society

ISSN:

02729172

ISBN:

9781558990128 [1558990127]

言語:

英語

請求記号:

M23500/139

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00015624
シリーズID:	PA00000011
会議名:	Symposium on high resolution microscopy of materials
回次:	1988
会議開催地:	Boston, MA, USA
会議開催年:	1988.11.29-1988.12.01

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