RBS/CHANNELING AND TEN ANALYSIS OF THIN SANDWICHED EPI-LAYERS OF GERMANIUM ON SILICON
- 著者名:
Swanson, M.L. Parikh, N.P. Frey, E.C. Sandhu, G.S. Chu, W.K. Baribeau, J.-M. Song, Kechang McCaffrey, J. Jackman, T.E. - 掲載資料名:
- Characterization of the structure and chemistry of defects in materials : symposium held November 28-December 3, 1988, Boston, Massachusetts, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 138
- 発行年:
- 1989
- 開始ページ:
- 581
- 終了ページ:
- 586
- 総ページ数:
- 6
- 出版情報:
- Pittsburgh, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558990111 [1558990119]
- 言語:
- 英語
- 請求記号:
- M23500/138
- 資料種別:
- 国際会議録
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