TEMPERATURE DEPENDENCE OF ETCH RATE AND RESIDUAL DAMAGE IN REACTIVELY ION ETCHED GaAs AND A1GaAs
- 著者名:
Pearton, S.J. Jones, K.S. Chakabarti, U.K. Emerson, B. Lane, E. Vasile, M.J. Fullowan, T.R. Hobson, W.S. Short, K.T. Haegel, N.M. - 掲載資料名:
- Laser and particle-beam chemical processes on surfaces : symposium held November 29-December 2, 1988, Boston, Massachusetts, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 129
- 発行年:
- 1989
- 開始ページ:
- 489
- 終了ページ:
- 494
- 総ページ数:
- 6
- 出版情報:
- Pittsburgh, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558990029 [155899002X]
- 言語:
- 英語
- 請求記号:
- M23500/129
- 資料種別:
- 国際会議録
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