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STRUCTURAL CHARACTERIZATION OF ION BEAM ENHANCED SOLID PHASE EPITAXIAL REGROWTH BY RAMAN, RBS, AND X-RAY ANALYSIS

著者名:
Knudsen, John F.
Bowman, Jr., R.C.
Adams, P.M.
Newman, R.
Hurrell, J.P.
Cole, R.C.
Halle, L.F.
Barker, D.H.
さらに 3 件
掲載資料名:
Advanced surface processes for optoelectronics : symposium held April 5-8, 1988, Reno, Nevada, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
126
発行年:
1988
開始ページ:
177
終了ページ:
182
総ページ数:
6
出版情報:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9780931837968 [0931837960]
言語:
英語
請求記号:
M23500/126
資料種別:
国際会議録

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