Blank Cover Image

*EPITAXIAL SILICIDES: A SUMMARY OF RECENT DEVELOPMENTS

著者名:
掲載資料名:
Interfacial structure, properties, and design : symposium held April 5-8, 1988, Reno, Nevada, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
122
発行年:
1988
開始ページ:
559
終了ページ:
572
総ページ数:
14
出版情報:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9780931837920 [0931837928]
言語:
英語
請求記号:
M23500/122
資料種別:
国際会議録

類似資料:

1 国際会議録 GROWTH AND EPITAXIAL CoSi2 AND NiSi2 ON (111), (100) AND (110) Si AT ROOM TEMPERATURE

Tung, R.T., Schrey, F.

Materials Research Society
7 国際会議録 THE FABRICATION OF NiSi2/Si(100) INTERFACES WITH CONTROLLED MORPHOLOGIES

Sullivan, J.P., Tung, R.T., Schrey, F., Graham, W.R.

Materials Research Society
2 国際会議録 TOPOGRAPHY OF Si (111): CLEAN SURFACE PREPARATION AND SILICON MOLECULAR BEAM EPITAXY

Tung, R.T., Schrey, F., Eaglesham, D.J.

Materials Research Society
8 国際会議録 Epitaxial Silicides

Tung, R. T., Poate, J. M., Bean, J. C., Gibson, J. M., Jacobson, D. C.

North-Holland
3 国際会議録 Epitaxial NiSi2 and CoSi2 Interfaces

Tung T. R., Levi J. F. A., Schrey F., Anzlowar M.

Plenum Press
9 国際会議録 GROWTH OF SINGLE CRYSTAL Si/NiSi2/Si(100) AND SiCoSi2/Si(100) STRUCTURES BY MOLECULAR BEAM EPITAXY AND FURNACE ANNEALING

Tung, R.T., Eaglesham, D.J., Schrey, F., Sullivan, J.P.

Materials Research Society
4 国際会議録 *ELECTRICAL PROPERTIES OF EPITAXIAL SILICIDE-SILICON INTERFACES

Tung, R.T., Levi, A.F.J., Gibson, J.M., Ng, K.K., Chantre, A.

Materials Research Society
10 国際会議録 PRREPARATION AND CHARACTERIZATION OF EPITAXIAL YYTRIUM SILICIDE ON (111) SILICON

Gurvitch, M., Levi, A. F. J., Tung, R. T., Nakahara, S.

Materials Research Society
5 国際会議録 THE FORMATION OF THIN LAYERS AND DOBLE HETEROSTRUCTURES OF EPITAXIAL SILICIDES

Tung, R.T., Gibson, J.M.

Materials Research Society
11 国際会議録 ADMITTANCE MEASUREMENT AT EPITAXIAL AND NONEPITAXIAL SILICIDE SCHOTTKY CONTACTS

Werner, J., Tung, R. T., Levi, A. F. J., Anzlowar, M.

Materials Research Society
6 国際会議録 Ti-Interlayer Mediated Epitaxy of CoSi2 with Ti Capping

Tung, R. T., Schrey, F.

MRS - Materials Research Society
12 国際会議録 *AN INTERFACIAL PHASE TRANSFORMATION IN CoSi2/Si (111)

Eaglesham, D.J., Tung, R.T., Headrick, R.L., Robinson, I.K., Schrey, F.

Materials Research Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12