FORMATION OF BURIED OXIDE IN MEV OXYGEN IMPLANTED SILICON
- 著者名:
Nieh, C. W. Xiong, F. Ahn, C. C. Zhou, Z. Jamieson, D. N. Vreeland Jr., T. Fultz, B. Tombrello, T. A. - 掲載資料名:
- Silicon-on-insulator and buried metals in semiconductors : symposium held November 30-December 3, 1987, Boston, Massachusetts, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 107
- 発行年:
- 1988
- 開始ページ:
- 73
- 終了ページ:
- 78
- 総ページ数:
- 6
- 出版情報:
- Pittsburgh, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9780931837753 [0931837758]
- 言語:
- 英語
- 請求記号:
- M23500/107
- 資料種別:
- 国際会議録
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