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X-RAY DIFFRACTION STUDY OF A THIN GaAs FILM ON Si (100)

著者名:
Bommannavar, Arun S.
Sparks, C. J.
Habenschuss, A.
Ice, G. E.
Dhere, A.
Morkoc, H.
Zabel, H.
さらに 2 件
掲載資料名:
Epitaxy of semiconductor layered structures : symposium held November 30-December 4, 1987, Boston, Massachusetts, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
102
発行年:
1988
開始ページ:
223
終了ページ:
228
総ページ数:
6
出版情報:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9780931837708 [0931837707]
言語:
英語
請求記号:
M23500/102
資料種別:
国際会議録

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