LIMITS ON THE ACCURACY OF STOICHIOMETRY DETERMINED BY RUTHERFORD BACKSCATTERING USING COMPUTER PEAK FITTING
- 著者名:
- 掲載資料名:
- Materials modification and growth using Ion beams : symposium held April 21-23, 1987, Anaheim, California, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 93
- 発行年:
- 1987
- 開始ページ:
- 401
- 終了ページ:
- 404
- 総ページ数:
- 4
- 出版情報:
- Pittsburgh, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9780931837609 [093183760X]
- 言語:
- 英語
- 請求記号:
- M23500/93
- 資料種別:
- 国際会議録
類似資料:
Materials Research Society |
Plenum Press |
Materials Research Society |
MRS - Materials Research Society |
Materials Research Society |
9
国際会議録
Edge-placement accuracy of opaque and clear defect repairs using focused ion beam technology
SPIE-The International Society for Optical Engineering |
Materials Research Society |
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
11
国際会議録
Computer-aided system for automatic peak searching and contour fitting in molecular spectra
SPIE-The International Society for Optical Engineering |
MRS - Materials Research Society |
SPIE - The International Society for Optical Engineering |