STRUCTURE DETERMINATION OF TILT BOUNDARIES IN GOLD BY HIGH RESOLUTION ELECTRON MICROSCOPY

STRUCTURE DETERMINATION OF TILT BOUNDARIES IN GOLD BY HIGH RESOLUTION ELECTRON MICROSCOPY

著者名:

掲載資料名:

Characterization of defects in materials : symposium held December 1-2, 1986, Boston, Massachusetts, U.S.A.

シリーズ名:

Materials Research Society symposium proceedings

シリーズ巻号:

82

発行年:

1987

開始ページ:

409

終了ページ:

414

総ページ数:

6

出版情報:

Pittsburgh, Pa.: Materials Research Society

ISSN:

02729172

ISBN:

9780931837470 [0931837472]

言語:

英語

請求記号:

M23500/82

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00015568
シリーズID:	PA00000011
会議名:	Symposium on characterization of defects in materials
回次:	1986
会議開催地:	Boston, MA, USA
会議開催年:	1986.12.01-1986.12.02

類似資料:

1 国際会議録 HIGH RESOLUTION ELECTRON MICROSCOPY OF TWIST GRAIN BOUNDARIES Krakow, William Materials Research Society	7 国際会議録 CHARACTERIZATION OF Mo/Si MULTILAYER STRUCTURES BY HIGH-RESOLUTION ELECTRON MICROSCOPY Chang, Chung-Hee, Stearns, Mary Beth, Smith, David J. Materials Research Society
2 国際会議録 CHARACTERTZATION OF GRAIN BOUNDARIES AND INTERFACES BY HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY Krakow, William Materials Research Society	8 国際会議録 HIGH RESOLUTION ELECTRON MICROSCOPY AND COMPUTER SIMULATION STUDIES OF THE ATOMIC STRUCTURE OF TILT BOUNDARIES IN TiO2 Liu, Yaping, Majid, Imtiaz, Sande, John B. Vander MRS - Materials Research Society
3 国際会議録 CHARACTERIZATION OF TILT BOUNDARIES BY ULTRA HIGH RESOLUTION ELECTRON MICROSCOPY Krakow, W., Wetzel, J. T., Smith, D. A., Trafas, G. Materials Research Society	9 国際会議録 Analysis of High Resolution Electron Microscope Images of the Pd2Si-Si Interface Krakow, W. North-Holland
4 国際会議録 EPITAXY OXIDATION AND SURFACE STRUCTURE OF COPPER ON GOLD FILMS BY HIGH RESOLUTION ELECTRON MICROSCOPY Krakow, W., Castano, V. Materials Research Society	10 国際会議録 Diffusion, Migration and the Atomic Structure of Some Grain Boundaries Krakow, W., Smith, D. A. Materials Research Society
5 国際会議録 HIGH RESOLUTION ELECTRON MICROSCOPY AND ELECTRON DIFFRACTION OF YBa2Cu3O7-X Krakow, William, Shaw, Thomas M. Materials Research Society	11 国際会議録 Detection of point defect chains in ion irradiated silicon by high resolution electron microscopy Krakow, W., Tan, T.Y., Foell, H. North Holland
6 国際会議録 ANALYSIS OF OXIDE SURFACES BY HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY Krakow, W., Castano, V. Materials Research Society	12 国際会議録 *ATOMIC RESOLUTION IMAGING OF SURFACES BY ELECTRON MICROSCOPY Smith, David, A. Materials Research Society

1

2

3

4

5

6

7

8

9

10

11

12