COMPOSITIONAL STUDIES OF SEMICONDUCTOR ALLOYS BY BRIGHT FIELDS ELECTRON MICROSCOPE IMAGING OF WEDGED CRYSTALS

COMPOSITIONAL STUDIES OF SEMICONDUCTOR ALLOYS BY BRIGHT FIELDS ELECTRON MICROSCOPE IMAGING OF WEDGED CRYSTALS

著者名:

掲載資料名:

Interfaces, superlattices, and thin films : symposium held December 1-6, 1986, Boston, Massachusetts, U.S.A.

シリーズ名:

Materials Research Society symposium proceedings

シリーズ巻号:

77

発行年:

1987

開始ページ:

473

終了ページ:

478

総ページ数:

6

出版情報:

Pittsburgh, Pa.: Materials Research Society

ISSN:

02729172

ISBN:

9780931837562 [0931837561]

言語:

英語

請求記号:

M23500/77

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00015562
シリーズID:	PA00000011
会議名:	Symposium on interfaces, superlattices, and thin films
回次:	1986
会議開催地:	Boston, MA, USA
会議開催年:	1986.12.01-1986.12.06

類似資料:

1 国際会議録 DIFFRACTION STUDIES OF METAL-SEMICONDUCTOR INTERFACES Cherns, D., Kiely, C.J., Eaglesham, D.J. Materials Research Society	7 国際会議録 ATOMIC RESOLUTION ELECTRON MICROSCOPY OF BISMUTH CUPRATES Ramesh, R., Bagley, B.G., Tarascon, J.M., Hetherington, C.J.D., Thomas, G., Green, S.M., Luo, H.L. Materials Research Society
2 国際会議録 THE BERKELEY ATOMIC RESOLUTION MICROSCOPE-AN UPDATE Hetherington, C.J.D., Nelson, W.C., Westmacott, K.H., Gronnsky, R., Thomas, G. Materials Research Society	8 国際会議録 Orientation Imaging in the Transmission Electron Microscope Wright,S.I., Dingley,D.J. Trans Tech Publications
3 国際会議録 HIGH RESOLUTION ELECTRON MICROSCOPY OF INTERFACES IN TOPOTAXIAL AND EPITAXIAL REACTIONS Dahmen, U., Douin, J., Hetherington, C.J.D., Westmocott, K.H. Materials Research Society	9 国際会議録 High Resolution Electron Microscopy and Convergent Beam Electron Diffraction of Semiconductor Quantum Well Structures Humphreys J. C. Plenum Press
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