THE MEYER-NELDEL RELATION AND ANALYSIS OF THE FIELD-EFFECT IN AMORPHOUS SILICON

THE MEYER-NELDEL RELATION AND ANALYSIS OF THE FIELD-EFFECT IN AMORPHOUS SILICON

著者名:

掲載資料名:

Materials issues in amorphous-semiconductor technology : symposium held April 15-18, 1986, Palo Alto, California, U.S.A.

シリーズ名:

Materials Research Society symposium proceedings

シリーズ巻号:

70

発行年:

1986

開始ページ:

173

終了ページ:

178

総ページ数:

6

出版情報:

Pittsburgh, Pa.: Materials Research Society

ISSN:

02729172

ISBN:

9780931837364 [0931837367]

言語:

英語

請求記号:

M23500/70

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00015556
シリーズID:	PA00000011
会議名:	Symposium on materials issues in amorphous-semiconductor technology
回次:	1986
会議開催地:	Palo Alto, CA, USA
会議開催年:	1986.04.15-1986.04.18

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