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RELATIVE LATTICE PARAMETER MEASUREMENT IN QUATERNARY (InGaAsP) LAYERS ON InP SUBSTRATES USING CONVERGENT BEAM ELECTRON DIFFRACTION

著者名:
Twigg, M.E.
Chu, S.N.G.
Joy, D.C.
Maher, D.M.
Macrander, A.T.
Nakahara, S.
Chin, A.K.
さらに 2 件
掲載資料名:
Materials characterization : symposium held April 15-17, 1986, Palo Alto California, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
69
発行年:
1986
開始ページ:
147
終了ページ:
152
総ページ数:
6
出版情報:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9780931837357 [0931837359]
言語:
英語
請求記号:
M23500/69
資料種別:
国際会議録

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