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MEASUREMENT OF THE BANDGAP OF GexSil-x/Si STRAINED-LAYER HETEROSTRUCTURES

著者名:
掲載資料名:
Layered structures and epitaxy : symposium held December 2-4, 1985, Boston, Massachusetts, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
56
発行年:
1985
開始ページ:
359
終了ページ:
364
総ページ数:
6
出版情報:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9780931837210 [0931837219]
言語:
英語
請求記号:
M23500/56
資料種別:
国際会議録

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