DEFECT STATES IN SILICON NITRIDE

DEFECT STATES IN SILICON NITRIDE

著者名:

掲載資料名:

Materials issues in applications of amorphous silicon technology : symposium held April 15-17, 1985, San Francisco, California, U.S.A.

シリーズ名:

Materials Research Society symposium proceedings

シリーズ巻号:

49

発行年:

1985

開始ページ:

215

終了ページ:

224

総ページ数:

10

出版情報:

Pittsburgh, Pa.: Materials Research Society

ISSN:

02729172

ISBN:

9780931837142 [0931837146]

言語:

英語

請求記号:

M23500/49

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00015535
シリーズID:	PA00000011
会議名:	Symposium on materials issues in applications of amorphous silicon technology
回次:	1985
会議開催地:	San Francisco, CA, USA
会議開催年:	1985.04.15-1985.04.17

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