Blank Cover Image

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY OF PROTON IMPLANTED GALLIUM ARSENIDE

著者名:
掲載資料名:
Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
46
発行年:
1985
開始ページ:
377
終了ページ:
384
総ページ数:
8
出版情報:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9780931837111 [0931837111]
言語:
英語
請求記号:
M23500/46
資料種別:
国際会議録

類似資料:

1 国際会議録 HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY STUDY OF Se+ IMPALNATED AND ANNEALED GaAs

Sadana, D. K., Sands, T., Washburn, J.

North-Holland
7 国際会議録 McV IMPLANTATION OF GALLIUM ARSENIDE

Kamber, H., Chen, J. C., Barger, M. J.

Materials Research Society
2 国際会議録 SHALLOW DOPING OF GALLIUM ARSENIDE BY RECOIL IMPLANTATION

Sadana, D. K., de Souza, J. P., Rutz, R. F., Cardone, F., Norcott, M. H.

Materials Research Society
8 国際会議録 HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY OF GaAs/AlAs HETERO-STRUCTURES IN THE <> PROJECTION

Ikarashi, N., Sakai, A., Baba, T., Ishida, K., Motohisa, J., Sakaki, H.

Materials Research Society
3 国際会議録 DAMAGE DISTRIBUTION STUDIES IN PROTON-IMPLANTED GaAs

Jenkinson, H. A., O'Tooni, M., Zavada, J. M., Haar, T. J.

North-Holland
9 国際会議録 In situ High-Resolution Transmission Electron Microscopy of Interfaces in Phase Transformations

Howe,J.M., Moore,K.T., Csontos,A.A., Benson,W.E., Tsai,M.M.

Trans Tech Publications
4 国際会議録 SHALLOW ION IMPLANTATION IN GALLIUM ARSENIDE MESFET TECHNOLOGY

de Souza, J. P., Sadana, D. K.

Materials Research Society
10 国際会議録 HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY V

Mazur, J. H., Grodzinaki, P., Nouhi, A., Stirn, R. J.

Materials Research Society
5 国際会議録 HIGH RESOLUTION TRIPLE AXIS DIFFRACTOMETRY IN INDIUM-CARBON AND GALLIUM-CARBON CO-IMPLANTED GALLIUM ARSENIDE

Horng, S. T., Madok, J. H., Haegel, N. M., Goorsky, M. S.

MRS - Materials Research Society
11 国際会議録 Optical Dielectric Response of Gallium Nitride Studied by Variable Angle Spectroscopic Ellipsometry

Yao, H., Yan, C. H., Jenkinson, H. A., Zavada, J. M., Speck, J. S., DenBaars, S. P.

MRS - Materials Research Society
6 国際会議録 HIGH DOSE IMPLANTATION OF NICKEL INTO SILICON

Campisi, G.J., Dietrich, H.B., Delfino, M., Sadana, D.K.

Materials Research Society
12 国際会議録 Erbium-related defects in gallium arsenide.(Invited)

Peaker,A.R., Coppinger,F., Efeoglu,H., Evans-Freeman,J.H., Maude,D.K., Portal,J.-C., Rutter,P., Sionger,K.E., …

Trans Tech Publications
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12