Blank Cover Image

THE MICROSTRUCTURE OF COPPER FILMS DEPOSITED BY E-BEAL EVAPORATION ONTO THIN POLYIMIDE FILMS

著者名:
掲載資料名:
Electronic packaging materials science : symposium held November 27-29, 1984, Boston, Massachusetts, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
40
発行年:
1985
開始ページ:
271
終了ページ:
276
総ページ数:
6
出版情報:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9780931837050 [0931837057]
言語:
英語
請求記号:
M23500/40
資料種別:
国際会議録

類似資料:

1 国際会議録 SURFACE RELIEF AND THE ORIENTATION OF VAPOR DEPOSITED FILMS

Smith, D. A., Wetzel, J. T., Taranko, A. R.

Materials Research Society
7 国際会議録 ZrO2 thin films deposited on various LiB3O5 substrates by electron beam evaporation

Tan, T., Huang, J., Zhan, M., Tian, G., Shao, J., Fan, Z.

SPIE - The International Society of Optical Engineering
2 国際会議録 REACTION KINETICS, STRESS AND MICROSTRUCTURE IN TITANIUM-COPPER-TITANIUM THIN FILMS

Hu, C.-K., Gupta, D., Wetzel, J.T., Ho, P.S.

Materials Research Society
8 国際会議録 Development of Thin Film Transistor Based Circuits on Flexible Polyimide Substrates

Constant, A., Burns, S.G., Shanks, H., Gruber, C., Landin, A., Schmidt, D., Thielen, C., Olympic, F., Schumacher, T., …

Electrochemical Society
3 国際会議録 MICROSTRUCTURES OF THE ELECTRON-BEAM EVAPORATED InSb THIN FILMS

Cheng, D.J., Yeh, S., Chi, G.F.

Materials Research Society
9 国際会議録 CHARACTERIZATION OF TILT BOUNDARIES BY ULTRA HIGH RESOLUTION ELECTRON MICROSCOPY

Krakow, W., Wetzel, J. T., Smith, D. A., Trafas, G.

Materials Research Society
4 国際会議録 Stress, Microstructure And Temperature Stability Of Reactive Sputter Deposited WNx Thin Films

Leedy, K.D., O'Keefe, M.J., Wilson, J.G., Osterday, R., Grant, J.T.

Materials Research Society
10 国際会議録 STRUCTURAL AND ELECTRICAL CHARACTERISTICS OF THE THERNALLY EVAPORATED InSb THIN FILMS

Yeh, S., Cheng, D.J., Chi, G.F., Chu, M.T.

Materials Research Society
5 国際会議録 In-Plane Anisotropy in CoCr(Ta,Pt)/Cr Films Deposited Onto Substrates With Controlled Topography

Twisselmann, D. J., Adekor, B. T., Farhoud, M., Smith, Henry I., Dorsey, P. C., Ross, C. A.

MRS - Materials Research Society
11 国際会議録 INTERDIFFUSION IN POLYIMIDE THIN FILMS

Kramer, E.J., Volksen, W., Russell, T.P.

Materials Research Society
6 国際会議録 Thin Films of CoSi2 Co Deposited Onto Si1-xGex Alloys

Goeller, Peter T., Boyanov, Boyan I., Sayers, Dale E., Nemanich, Robert J.

MRS - Materials Research Society
12 国際会議録 Stress, microstructure and temperature stability of reactive sputter deposited Ta(N) thin films

Leedy, K. D., O'Keefe, M. J., Grant, J. T.

MRS-Materials Research Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12