MEASUREMENTS OF ION-IMPLANTATION DAMAGE IN GaP

MEASUREMENTS OF ION-IMPLANTATION DAMAGE IN GaP

著者名:

Myers, D. R.
Peercy, P. S.
Gourley, P.L. ( Sandia National Laboratories, Albuquerque, NM )

掲載資料名:

Defects in semiconductors II : symposium held November 1982 in Boston, Massachusetts, U.S.A.

シリーズ名:

Materials Research Society symposium proceedings

シリーズ巻号:

14

発行年:

1983

開始ページ:

505

終了ページ:

510

総ページ数:

6

出版情報:

New York: North-Holland

ISSN:

02729172

ISBN:

9780444008121 [0444008128]

言語:

英語

請求記号:

M23500/14

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00015498
シリーズID:	PA00000011
会議名:	Symposium on defects in semiconductors
回次:	2nd
会議開催地:	Boston, MA, USA
会議開催年:	1982.11.00

類似資料:

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2 国際会議録 STRESS RELEASE IN ION IMPLANTED LATTICE MISMATCHED SEMICONDUCTOR HETEROSTRUCTURES Arnold, G.W., Picraux, S.T., Myers, D.R., Doyle, B.L., Peercy, P.S., Biefeld, R.M., Dawson, L.R. Materials Research Society	8 国際会議録 ACCUMULATION OF IMPLANTATION DAMAGE IN MeV IMPLANTED DIAMOND CRYSTALS Hunn, John D., Withrow, S. P., Clausing, R. E., Heatherly, L., Bentley, J., Hembree, D. M., Jr., Parikh, N. R. MRS - Materials Research Society
3 国際会議録 Integration of electro-optical mechanical systems and medicine:where are we and where can we go? Gourley,M.F., D,M., Gourley,P.L. SPIE-The International Society for Optical Engineering	9 国際会議録 REGROWTH OF DAMAGED LAYERS IN DIAMOND PRODUCED BY ION IMPLANTATION Sandhu, G.S., Liu, B., Parikh, N.R., Hunn, J.D., Swanson, M.L., Wichert, Th., Deicher, M., Skudlik, H., Lennard, W.N., … Materials Research Society
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5 国際会議録 AN EVALUATION OF IMPLANTATION-DISORDERING OF (InGa)As/GaAs STRAINED-LAYER SUPERLATTICES Myers, D. R., Barnes, C. E., Arnold, G. W., Dawson, L. R., Biefeild, R. M., Zipperian, T. E., Gourley, P. L., Fritz, I. … Materials Research Society	11 国際会議録 Degradation of optoelectronic properties of semiconductors by biofluids and mitigation by polymer overlayers Gourley, P.L., Copeland, R.G., Cox, J.D., Hendricks, J.K., McDonald, A.E., Peterson, S.L., Sasaki, D.Y. SPIE-The International Society for Optical Engineering
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