Heavy-Ion Induced Single-Event Upset in Integrated Circuits
- 著者名:
- Zoutendijk, J.
- 掲載資料名:
- Proceedings of the ESA Electronic Components Conference, held at the Conference Centre, ESTEC, Noordwijk, the Netherlands, 12-16 November 1990
- シリーズ名:
- ESA SP
- シリーズ巻号:
- 313
- 発行年:
- 1991
- 開始ページ:
- 357
- 終了ページ:
- 362
- 総ページ数:
- 6
- 出版情報:
- Paris: ESA Publications Division
- ISSN:
- 03796566
- ISBN:
- 9789290920946 [9290920947]
- 言語:
- 英語
- 請求記号:
- E11690/911401
- 資料種別:
- 国際会議録
類似資料:
European Space Agency |
European Space Agency |
ESA Publication Division | |
3
国際会議録
Comparative Simulations of Single Event Upsets Induced by Protons and Neutrons in Commercial SRAMs.
ESA Publication Division |
ESA Publications Division |
Electrochemical Society |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
ESA Publications Division |
SPIE-The International Society for Optical Engineering |
ESA Publication Division |