Electrical Characterization of Thin Gate Oxynitride Obtained by N+ Implantation into Polysilicon/ Thermal Oxide/ Silicon Structure
- 著者名:
- 掲載資料名:
- Microelectronics technology and devices : SBMICRO 2004 : proceedings of the nineteenth international symposium
- シリーズ名:
- Electrochemical Society Proceedings Series
- シリーズ巻号:
- 2004-03
- 発行年:
- 2004
- 開始ページ:
- 331
- 終了ページ:
- 338
- 総ページ数:
- 8
- 出版情報:
- Pennington, N.J.: Electrochemical Society
- ISSN:
- 01616374
- ISBN:
- 9781566774161 [1566774160]
- 言語:
- 英語
- 請求記号:
- E23400/200403
- 資料種別:
- 国際会議録
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