(4.25) 8:37 - 8:40 PM - Low Frequency Noise Mechanisms in Si and Pseudomorphic SiGe p-Channel Field-Effect Transistors
- 著者名:
Prest, M. J. Fulgoni, D. J. F. Bacon, A. R. Grasby, T. J. Parker, E. H. C. Whall, T. E. (U. Warwick) - 掲載資料名:
- SiGe: materials, processing, and devices : proceedings of the First international symposium
- シリーズ名:
- Electrochemical Society Proceedings Series
- シリーズ巻号:
- 2004-07
- 発行年:
- 2004
- 開始ページ:
- 327
- 終了ページ:
- 334
- 総ページ数:
- 8
- 出版情報:
- Pennington, N.J.: Electrochemical Society
- ISSN:
- 01616374
- ISBN:
- 9781566774208 [1566774209]
- 言語:
- 英語
- 請求記号:
- E23400/200407
- 資料種別:
- 国際会議録
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