Reliability Challenges for sub-90nm Technology Dielectrics
- 著者名:
- Puchner, H.
- 掲載資料名:
- Dielectrics for nanosystems: materials science, processing, reliability, and manufacturing : proceedings of the First international symposium
- シリーズ名:
- Electrochemical Society Proceedings Series
- シリーズ巻号:
- 2004-04
- 発行年:
- 2004
- 開始ページ:
- 239
- 終了ページ:
- 249
- 総ページ数:
- 11
- 出版情報:
- Pennington, N.J.: Electrochemical Society
- ISSN:
- 01616374
- ISBN:
- 9781566774178 [1566774179]
- 言語:
- 英語
- 請求記号:
- E23400/200404
- 資料種別:
- 国際会議録
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11
国際会議録
36 Ultrathin plasma nitrided oxide gate dielectrics for sub-100 nm generation CMOS technology
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