PECVD Induced Damage on Ultrathin SiO2 Layers
- 著者名:
- 掲載資料名:
- Silicon nitride, silicon dioxide thin insulating films, and other emerging dieletrics VIII : proceedings of the international symposium
- シリーズ名:
- Electrochemical Society Proceedings Series
- シリーズ巻号:
- 2005-01
- 発行年:
- 2005
- 開始ページ:
- 74
- 終了ページ:
- 85
- 総ページ数:
- 12
- 出版情報:
- Pennington, N.J.: Electrochemical Society
- ISSN:
- 01616374
- ISBN:
- 9781566774598 [1566774594]
- 言語:
- 英語
- 請求記号:
- E23400/200501
- 資料種別:
- 国際会議録
類似資料:
1
国際会議録
Radiation Induced Charge Loss Mechanisms Across the Dielectrics of Floating Gate Flash Memories
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