A New Method of Diagnosing Simultaneous Multiple Faults via Neural Networks
- 著者名:
- Lee, S. ( Korea Advanced Institute of Science & Technology, Taejon, Korea )
- Park, S. ( Korea Advanced Institute of Science & Technology, Taejon, Korea )
- Himmelblau, D. ( University of Texas at Austin, Austin, TX )
- 掲載資料名:
- AIChE ANNUAL MEETING - NOVEMBER 16-21, 1997 - LOS ANGELES, CA
- シリーズ名:
- AIChE meeting [papers]
- シリーズ巻号:
- 1997
- 発行年:
- 1997
- ペーパー番号:
- 215b
- 総ページ数:
- 26
- 出版情報:
- New York: American Institute of Chemical Engineers
- 言語:
- 英語
- 請求記号:
- A08000
- 資料種別:
- 国際会議録
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