ELVIN, FRANK J., P., OSCAR PALLOTTA
American Institute of Chemical Engineers
|
Batiot, C., Cassidy, F. E., Doyle, A. M., Hodnett, B. K.
Elsevier
|
Tu, Shiying, Chen, Zubi, Fan, Zhongbi
American Chemical Society
|
M., P. Gamero, M., C. Maldonado, M., J. C. Moreno, M., O. Guzman, M., E. Mojica, S., R. Gonzalez
Elsevier
|
Banares, M. A., Martinez-Huerta, M., Gao, X., Wachs, I. E., Fierro, J. L. G.
Elsevier
|
Xiao, X., Zhang, Z., Ye, M., Ye, J., He, Z.
SPIE - The International Society of Optical Engineering
|
Todd Eaton, Justin M. Notestein, Kimberly A. Gray, Andrew Boston, Anthony B. Thompson
American Institute of Chemical Engineers
|
Wang, Y.-M., Shu, X.-T., He, M.-Y.
Elsevier
|
Sankar,G., Raja,R., Thomas,J.M., Gleeson,D.
Kluwer Academic Publishers
|
X. M. Liu, J. He, J. Lu, X. W. Ni
Society of Photo-optical Instrumentation Engineers
|
Clark, F. T., Hensley, A. L., Shyu, J. Z., Kaduk, J. A., Ray, G. J.
Elsevier
|
X. M. Liu, J. He, J. Lu, X. W. Ni
Society of Photo-optical Instrumentation Engineers
|