Anisotropic etching of dielectrics exposed by high intensity femtosecond pulses
- 著者名:
- Juodkazis, S. ( CREST-JST (Japan) and Research Institute for Electronic Science. Hokkaido Univ. (Japan) )
- Tabuchi, Y. ( The Univ. of Tokushima (Japan) )
- Ebisui, T. ( The Univ. of Tokushima (Japan) )
- Matsuo, S. ( The Univ. of Tokushima (Japan) )
- Misawa, H. ( CREST-JST (Japan) and Research Institute for Electronic Science. Hokkaido Univ. (Japan) )
- 掲載資料名:
- Advanced laser technologies 2004 : 10-15 September, 2004, Rome and Frascati, Italy
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 5850
- 発行年:
- 2004
- 開始ページ:
- 59
- 終了ページ:
- 66
- 総ページ数:
- 8
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819458476 [0819458473]
- 言語:
- 英語
- 請求記号:
- P63600/5850
- 資料種別:
- 国際会議録
類似資料:
SPIE-The International Society for Optical Engineering |
7
国際会議録
GaN Surface ablation by femtosecond pulses:atomic force microscopy studies and accumulation effects
SPIE - The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |