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High frequency noise of SOI MOSFETs: performances and limitations (Invited Paper)

著者名:
  • Danneville, F. ( Institut d'Electronique, de Microelectronique et de Nanotechnologie (France) )
  • Pailloncy, G. ( Institut d'Electronique, de Microelectronique et de Nanotechnologie (France) )
  • Siligaris, A. ( Institut d'Electronique, de Microelectronique et de Nanotechnologie (France) )
  • Iniguez, B. ( Univ. Rovira i Virgili (Spain) )
  • Dambrine, G. ( Institut d'Electronique, de Microelectronique et de Nanotechnologie (France) )
掲載資料名:
Noise in devices and circuits III : 24-26 May, 2005, Austin, Texas, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5844
発行年:
2005
開始ページ:
185
終了ページ:
199
総ページ数:
15
出版情報:
Bellingham, Washington: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819458391 [0819458392]
言語:
英語
請求記号:
P63600/5844
資料種別:
国際会議録

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