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Embedded design-for-testability strategies to test high-resolution SD modulators

著者名:
Escalera, S. ( Instituto de Microelectronica de Sevilla-CNM-CSIC (Spain) )
Espin, A. ( Instituto de Microelectronica de Sevilla-CNM-CSIC (Spain) )
Guerra, O. ( Instituto de Microelectronica de Sevilla-CNM-CSIC (Spain) )
de la Rosa, J. M. ( Instituto de Microelectronica de Sevilla-CNM-CSIC (Spain) )
Medeiro, F. ( Instituto de Microelectronica de Sevilla-CNM-CSIC (Spain) )
Perez-Verdu, B. ( Instituto de Microelectronica de Sevilla-CNM-CSIC (Spain) )
さらに 1 件
掲載資料名:
VLSI Circuits and Systems II
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5837
発行年:
2005
開始ページ:
491
終了ページ:
501
総ページ数:
11
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819458322 [0819458325]
言語:
英語
請求記号:
P63600/5837-1
資料種別:
国際会議録

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