Imaging Fourier transform spectrometer (IFTS): parametric sensitivity analysis

Imaging Fourier transform spectrometer (IFTS): parametric sensitivity analysis

著者名:

Keller, R. A. ( The Aerospace Corp. (USA) )
Lomheim, T. S. ( The Aerospace Corp. (USA) )

掲載資料名:

Algorithms and technologies for multispectral, hyperspectral, and ultraspectral imagery XI : 28 March-1 April, 2005, Orlando, Florida, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5806

発行年:

2005

開始ページ:

267

終了ページ:

287

総ページ数:

21

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819457912 [0819457914]

言語:

英語

請求記号:

P63600/5806-1

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00015038
シリーズID:	PA00000029
会議名:	Defense, Security, and Sensing : Algorithms and Technologies for Multispectral, Hyperspectral, and Ultraspectral Imagery
回次:	2005 : 11th
会議開催地:	Orlando, FL, USA
会議開催年:	2005.03.28-2005.04.01

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